Martensitic Transformation in Ni-Mn-Ga Thin Films Deposited on Alumina

Authors

Michael Hagler, Boise State UniversityFollow
Volodymyr A. Chernenko, Institute of Magnetism
Makoto Ohtsuka, Tohoku University
Stefano Besseghini, CNR-IENI
Peter Müllner, Boise State UniversityFollow

Document Type

Conference Proceeding

Publication Date

2009

Abstract

Ni-Mn-Ga magnetic shape memory alloys (MSMAs) tend to undergo a large, reversible deformation upon the application of a magnetic field. This deformation is attributed to twin boundary motion in the martensitic phase. In an effort to utilize the magneto-mechanical behavior of Ni-Mn-Ga polycrystalline thin films for micro-sensors and actuators, the behavior of Ni- Mn-Ga thin films is paid a great attention last few years. Substrate curvature measurements on Ni-Mn-Ga films, deposited on Al₂O₃ ceramics, were performed. The martensitic transformation in the film is manifested by an anomalous stress change accompanied by thermal hysteresis. The stress-curvature experiments display a stress relaxation during the martensitic transformation of approximately 30–100 MPa, depending on film thickness.

Publication Information

Hagler, Michael; Chernenko, Volodymyr A.; Ohtsuka, Makoto; Besseghini, Stefano; and Müllner, Peter. (2009). "Martensitic Transformation in Ni-Mn-Ga Thin Films Deposited on Alumina". Proceedings of the International Conference on Martensitic Transformations ‘ICOMAT’08’, Santa Fe, NM, June 29-July 5, 2008, (2009), 453-457.