Texture and Transformation Characteristics of Ni–Mn–Ga Films Deposited on Alumina

Authors

Volodymyr A. Chernenko, Institute of Magnetism
Manfred Kohl, IMT
Stephen Doyle, ANKA
Peter Müllner, Boise State UniversityFollow
Makoto Ohtsuka, Tohoku University

Document Type

Article

Publication Date

4-2006

Abstract

X-ray diffraction mapping in synchrotron experiments shows a fiber texture in microcrystalline Ni–Mn–Ga films deposited and annealed on an alumina ceramic substrate. The texture scans do not reveal a significant in-plane orientation preference. Resistivity curves show that the onset of martensitic transformation depends non-monotonically on the film thickness. This dependence is correlated with the behavior of texture as a function of film thickness. A magnetic field-induced actuation is obtained for a film/substrate thickness ratio of 1/30.

Publication Information

Chernenko, Volodymyr A.; Kohl, Manfred; Doyle, Stephen; Müllner, Peter; and Ohtsuka, Makoto. (2006). "Texture and Transformation Characteristics of Ni–Mn–Ga Films Deposited on Alumina". Scripta Materialia, 54(7), 1287-1291. https://doi.org/10.1016/j.scriptamat.2005.12.020