"Properties of Sputter-Deposited Ni–Mn–Ga Thin Films" by Volodymyr A. Chernenko, Stefano Besseghini et al.
 

Properties of Sputter-Deposited Ni–Mn–Ga Thin Films

Document Type

Article

Publication Date

5-25-2008

Abstract

Sub-micrometer Ni–Mn–Ga films on MgO(0 0 1) single-crystalline wafers have been prepared by radio-frequency magnetron sputtering. The structural and magnetic states of the as-received (quasi-amorphous phase) and annealed (highly ordered martensitic phase at T = 300 K) films have been examined by X-ray diffraction, and measurements of resistivity and magnetization. The annealed films demonstrate a transformation behavior typical for the bulk and show a thickness dependence of the magnetic properties.

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