Abstract Title
Epitaxial ScFeO3 films studied by ultraviolet Raman spectroscopy
Additional Funding Sources
This project was supported by Boise State University.
Abstract
Scandium ferrite, ScFeO3 is recently discovered to be multiferroic, i.e. a material that exhibits coexisting ferroelectric and magnetic ordering. We present a study of epitaxial ScFeO3 thin films by variable temperature ultraviolet Raman spectroscopy. The 10 and 100 nm-thick films were grown by molecular-beam epitaxy on (0001) Al2O3 substrates. Room temperature Raman spectra show that ScFeO3 films have a polar hexagonal P63cm structure. The temperature evolution of the Raman spectra of a ScFeO3 film measured in the range 10–1300 K indicate a transition to a non-polar (likely P63/mmc) phase; fitting of the temperature dependence of the Raman intensities yields a transition temperature of 950±50 K. High temperature Raman spectra indicate that there may be another structural transition around 1300 K. Raman spectroscopy results are consistent with other characterization data (x-ray diffraction, second harmonic generation) obtained by our collaborators.
Epitaxial ScFeO3 films studied by ultraviolet Raman spectroscopy
Scandium ferrite, ScFeO3 is recently discovered to be multiferroic, i.e. a material that exhibits coexisting ferroelectric and magnetic ordering. We present a study of epitaxial ScFeO3 thin films by variable temperature ultraviolet Raman spectroscopy. The 10 and 100 nm-thick films were grown by molecular-beam epitaxy on (0001) Al2O3 substrates. Room temperature Raman spectra show that ScFeO3 films have a polar hexagonal P63cm structure. The temperature evolution of the Raman spectra of a ScFeO3 film measured in the range 10–1300 K indicate a transition to a non-polar (likely P63/mmc) phase; fitting of the temperature dependence of the Raman intensities yields a transition temperature of 950±50 K. High temperature Raman spectra indicate that there may be another structural transition around 1300 K. Raman spectroscopy results are consistent with other characterization data (x-ray diffraction, second harmonic generation) obtained by our collaborators.
Comments
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