Ultraviolet Raman Spectroscopy of Lead Zirconate Titinate Nanotubes
Faculty Mentor Information
Dmitri A Tenne
Presentation Date
7-2016
Abstract
Lead zirconate titanate, PbZr1-xTixO3 (PZT) nanotubes of different wall thicknesses ranging from 3 to 80 nm deposited on (001) -oriented SrTiO3 substrates have been studied by variable-temperature ultraviolet Raman spectroscopy. Spectra were measured in the temperature range of 10 – 800 K with ultraviolet excitation by a 325 nm He-Cd laser. The spectra of the PZT thin film were measured for comparison. Analysis of temperature dependence of Raman intensities allowed us to determine ferroelectric phase transition temperature as a function of wall thickness, which was found to vary from ~100 to 650 K. At wall thicknesses above 20 nm the he phase transition temperature of the nanotubes aproaches its bulk value.
Ultraviolet Raman Spectroscopy of Lead Zirconate Titinate Nanotubes
Lead zirconate titanate, PbZr1-xTixO3 (PZT) nanotubes of different wall thicknesses ranging from 3 to 80 nm deposited on (001) -oriented SrTiO3 substrates have been studied by variable-temperature ultraviolet Raman spectroscopy. Spectra were measured in the temperature range of 10 – 800 K with ultraviolet excitation by a 325 nm He-Cd laser. The spectra of the PZT thin film were measured for comparison. Analysis of temperature dependence of Raman intensities allowed us to determine ferroelectric phase transition temperature as a function of wall thickness, which was found to vary from ~100 to 650 K. At wall thicknesses above 20 nm the he phase transition temperature of the nanotubes aproaches its bulk value.
Comments
Poster #Th54