Long Term Stability Study of Planar, Two-Terminal Field Emitters

Authors

Ranajoy Bhattacharya, Boise State UniversityFollow
Marco Turchetti, Massachusetts Institute of Technology
P. Donald Keithley, Massachusetts Institute of Technology
Karl K. Berggren, Massachusetts Institute of Technology
Jim Browning, Boise State UniversityFollow

Document Type

Conference Proceeding

Publication Date

2021

Abstract

Two different types of planar nano-scale (4–5 nm) field emitters, bowtie and diode devices, were characterized for use as electron sources for vacuum nano-transistors. I-V measurements were performed, and long-term stability tests were conducted in a dedicated life-time test chamber under high vacuum environment (~5×10⁻⁸ Torr). Experiments showed that the maximum field emission current was ≈ 3 nA from bowtie devices for a bias voltage of 6 V and ≈ 15 nA from diode devices at a bias voltage of 8 V. A long-term stability study showed that although one diode device failed at ≈ 300 hr, three other devices emitted a stable current (< 5 % Drop) for > 1000 hrs. of continuous operation at a DC bias of 6 V.

Publication Information

Bhattacharya, Ranajoy; Turchetti, Marco; Keithley, P. Donald; Berggren, Karl K.; and Browning, Jim. (2021). "Long Term Stability Study of Planar, Two-Terminal Field Emitters". 2021 22nd International Vacuum Electronics Conference (IVEC), . https://doi.org/10.1109/IVEC51707.2021.9722417