Comparison of the Electrical Response of Cu and Ag Ion-Conducting SDC Memristors Over the Temperature Range 6 K to 300 K

Authors

Kolton Drake, Boise State University
Tonglin Lu, Boise State University
Md. Kamrul H. Majumdar, Boise State University
Kristy A. Campbell, Boise State UniversityFollow

Document Type

Article

Publication Date

10-2019

Abstract

Electrical performance of self-directed channel (SDC) ion-conducting memristors which use Ag and Cu as the mobile ion source are compared over the temperature range of 6 K to 300 K. The Cu-based SDC memristors operate at temperatures as low as 6 K, whereas Ag-based SDC memristors are damaged if operated below 125 K. It is also observed that Cu reversibly diffuses into the active Ge₂Se₃ layer during normal device shelf-life, thus changing the state of a Cu-based memristor over time. This was not observed for the Ag-based SDC devices. The response of each device type to sinusoidal excitation is provided and shows that the Cu-based devices exhibit hysteresis lobe collapse at lower frequencies than the Ag-based devices. In addition, the pulsed response of the device types is presented.

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

Publication Information

Drake, Kolton; Lu, Tonglin; Majumdar, Md. Kamrul H.; and Campbell, Kristy A.. (2019). "Comparison of the Electrical Response of Cu and Ag Ion-Conducting SDC Memristors Over the Temperature Range 6 K to 300 K". Micromachines, 10(10), 663-1 - 663-15. https://dx.doi.org/10.3390/mi10100663