Dynamics of Silver Photo-Diffusion into Ge-Chalcogenide Films: Time-Resolved Neutron Reflectometry

Authors

M. Ailavajhala, Boise State University
M. R. Latif, Boise State University
K. Wolf, Boise State University
M. Mitkova, Boise State UniversityFollow
M. W.A. Skoda, Boise State University

Document Type

Conference Proceeding

Publication Date

2015

DOI

http://dx.doi.org/10.1088/1742-6596/619/1/012046

Abstract

Silver diffuses into an amorphous (a-) chalcogenide layer while visible light illuminates Ag/a-chalcogenide films and neutron reflectometry is a suitable technique probing time evolution of the depth profiles without damaging the sample by the probe beam itself. In this paper, we report the results of time-resolved neutron reflectivity measurements of a-Ge₄₀Se₆₀/Ag/ Si films taken while the films are exposed to visible light. From the measurements, we found enormous changes in the neutron reflectivity profile, including a loss of total reflection region, with continuous illumination even after forming one homogeneous layer, which occurred about 50 min after starting illumination. At this stage, a clear off-specular scattering was observed by a linear detector and a surface roughness was observed with naked eyes.

Comments

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Copyright Statement

This document was originally published by IOP Publishing in Journal of Physics: Conference Series. This work is provided under a Creative Commons Attribution 3.0 license. Details regarding the use of this work can be found at: http://creativecommons.org/licenses/by/3.0/. doi: 10.1088/1742-6596/619/1/012046

Publication Information

Ailavajhala, M.; Latif, M.R.; Wolf, K.; Mitkova, M.; and Skoda, M.W.A. (2015). "Dynamics of Silver Photo-Diffusion into Ge-Chalcogenide Films: Time-Resolved Neutron Reflectometry". Journal of Physics: Conference Series, 619, 012046-1 - 012046-4. http://dx.doi.org/10.1088/1742-6596/619/1/012046