Texture and Transformation Characteristics of Ni–Mn–Ga Films Deposited on Alumina
X-ray diffraction mapping in synchrotron experiments shows a fiber texture in microcrystalline Ni–Mn–Ga films deposited and annealed on an alumina ceramic substrate. The texture scans do not reveal a significant in-plane orientation preference. Resistivity curves show that the onset of martensitic transformation depends non-monotonically on the film thickness. This dependence is correlated with the behavior of texture as a function of film thickness. A magnetic field-induced actuation is obtained for a film/substrate thickness ratio of 1/30.
Chernenko, Volodymyr A.; Kohl, Manfred; Doyle, Stephen; Müllner, Peter; and Ohtsuka, Makoto. (2006). "Texture and Transformation Characteristics of Ni–Mn–Ga Films Deposited on Alumina". Scripta Materialia, 54(7), 1287-1291. http://dx.doi.org/10.1016/j.scriptamat.2005.12.020