Texture and Transformation Characteristics of Ni–Mn–Ga Films Deposited on Alumina

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X-ray diffraction mapping in synchrotron experiments shows a fiber texture in microcrystalline Ni–Mn–Ga films deposited and annealed on an alumina ceramic substrate. The texture scans do not reveal a significant in-plane orientation preference. Resistivity curves show that the onset of martensitic transformation depends non-monotonically on the film thickness. This dependence is correlated with the behavior of texture as a function of film thickness. A magnetic field-induced actuation is obtained for a film/substrate thickness ratio of 1/30.