Document Type

Conference Proceeding

Publication Date

2015

Abstract

Silver diffuses into an amorphous (a-) chalcogenide layer while visible light illuminates Ag/a-chalcogenide films and neutron reflectometry is a suitable technique probing time evolution of the depth profiles without damaging the sample by the probe beam itself. In this paper, we report the results of time-resolved neutron reflectivity measurements of a-Ge40Se60/Ag/ Si films taken while the films are exposed to visible light. From the measurements, we found enormous changes in the neutron reflectivity profile, including a loss of total reflection region, with continuous illumination even after forming one homogeneous layer, which occurred about 50 min after starting illumination. At this stage, a clear off-specular scattering was observed by a linear detector and a surface roughness was observed with naked eyes.

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Copyright Statement

This document was originally published by IOP Publishing in Journal of Physics: Conference Series. This work is provided under a Creative Commons Attribution 3.0 license. Details regarding the use of this work can be found at: http://creativecommons.org/licenses/by/3.0/. doi: 10.1088/1742-6596/619/1/012046

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