Magnetic Force Images Using Capacitive Coupling Effect

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There are several conventional approaches for mapping magnetic field distributions. Optical techniques based on the Kerr effect have moderate spatial resolution of about 0.5 μm. Bitter pattern technique causes degradation of the sample surface. Although electron beam imaging techniques like Lorentz microscopy, scanning electron micro- scope with polarization analysis (SEMPA), and differential phase contrast (DPC) STEM are known to have higher spatial resolution, sample preparation and operation are difficult. But magnetic force microscopy (MFM) needs no special sample preparation and provides different and somewhat complementary information to e-beam imaging techniques as well as high spatial resolution (10-100 nm).

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