Summary & Purpose
These files are transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) images from a single TEM lamellae. Images are collected using FEI Tecnai TF30-FEG STEM at a variety of magnifications to enable characterization of various features including grains/laths, carbide precipitates, dislocation lines, nanoscale phases, dislocation loops (if present), and voids (if present).
Date of Publication or Submission
This research was sponsored in part by the US Nuclear Regulatory Commission Grant NRC-HQ-84-14-G-0056, the Micron Foundation, and by the US DOE, Office of Nuclear Energy under DOE Idaho Operations Office Contract DE-AC07-05ID14517, as part of the Nuclear Science User Facilities experiments 13-419, 14-486, 15-540, 15-569, 16-625, and 16-710.
Single Dataset or Series?
TEM image format is .dm3 These files may be viewed in either Digital Micrograph or ImageJ. In these software packages, scaling information is retained. Files may be converted to different format (e.g. .jpeg), but scaling information is thus lost. STEM image format is .tif These files may be viewed in any photo or image viewer.
Irradiation conducted at Michigan Ion Beam Laboratory (MIBL). Dose rate = 1.2 x 10^(-5) dpa/s. TEM lamellae were prepared using an FEI Quanta 3D FEG focused ion beam (FIB) at the Center for Advanced Energy Studies (CAES). TEM lamellae were cut and lifted perpendicular to the surface of the bulk. This orientation provided a cross-section of the damage profile through the depth of the TEM film. Prior to milling, all specimen surfaces were protected with a 3 µm platinum deposit, which ensured that the original proton-irradiated surface was retained for reference. Each sample was milled at 30 kV to an estimated thickness of ~100 nm, width of ~15 µm, and depth of ~7 µm. The samples were subsequently milled at 5 kV to an estimated thickness of 50-100 nm, followed by cleaning at 2 kV for approximately 1 minute on each side. The purpose of the cleaning process was to reduce any surface damage to the sample caused by the milling. Dislocation loops were imaged in STEM mode in which small collection (ß) and convergence (a) angles are applied to create a STEM bright field image.
TEM imaging conducted on 20141111 and 20151012.
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Swenson, Matthew and Wharry, Janelle. (2017). HT9, Proton irradiated to 3 dpa at 500C, TEM Images [Data set]. Retrieved from http://dx.doi.org/10.18122/B2BP44