Low-Cost Test and Characterization Platform for Memristors

Document Type

Conference Proceeding

Publication Date



Characterization of Memristor devices is an expensive and difficult task due to the large variety of their types. The problem is compounded by the incompatibility of electrical characterization tools with different types of memristors, which in turn increases the cost associated with the overall integration process. This paper reports a novel, low-cost, portable test and characterization platform for memristors with a voltage range from -10V to +10V. To demonstrate its performance, columnar cationic memristors were characterized in this setup to study resistance behavior. The platform has the potential to be a lowcost alternative to the traditional bulky characterization equipment and could be used to characterize a variety of devices (e.g. Anion, phase-change,…etc).