Low-Cost Test and Characterization Platform for Memristors
Document Type
Conference Proceeding
Publication Date
2021
Abstract
Characterization of Memristor devices is an expensive and difficult task due to the large variety of their types. The problem is compounded by the incompatibility of electrical characterization tools with different types of memristors, which in turn increases the cost associated with the overall integration process. This paper reports a novel, low-cost, portable test and characterization platform for memristors with a voltage range from -10V to +10V. To demonstrate its performance, columnar cationic memristors were characterized in this setup to study resistance behavior. The platform has the potential to be a lowcost alternative to the traditional bulky characterization equipment and could be used to characterize a variety of devices (e.g. Anion, phase-change,…etc).
Publication Information
Jones, Lyle; Mitkova, Maria; and Rafla, Nader. (2021). "Low-Cost Test and Characterization Platform for Memristors". 2021 IEEE Workshop on Microelectronics and Electron Devices (WMED), 32-35. https://doi.org/10.1109/WMED49473.2021.9425110