Stable Magnetic-Field-Induced Strain Above 1% in Polycrystalline Ni–Mn–Ga

Authors

Uwe Gaitzsch, IFW Dresden
Jan Romberg, IFW Dresden
Martin Pötschke, IFW Dresden
Stefan Roth, IFW Dresden
Peter Müllner, Boise State UniversityFollow

Document Type

Article

Publication Date

10-1-2011

Abstract

Polycrystalline Ni–Mn–Ga samples were directionally solidified and trained in order to lower the twinning stress. Polyurethane was used to fill the cracks. Magnetic-field-induced strain (MFIS) was measured in a rotating magnetic field over more than 10⁶ cycles. The operating temperature was varied between 0 and 45 °C. With increasing temperature, the MFIS increased from 0.6% to 1.2%. After cooling to room temperature, an enhanced MFIS of 1.0% was retained and maintained over another 10⁶ cycles.

Publication Information

Gaitzsch, Uwe; Romberg, Jan; Pötschke, Martin; Roth, Stefan; and Müllner, Peter. (2011). "Stable Magnetic-Field-Induced Strain Above 1% in Polycrystalline Ni–Mn–Ga". Scripta Materialia, 65(8), 679-682. https://doi.org/10.1016/j.scriptamat.2011.07.011