Multicomponent Wavefield Characterization with a Novel Scanning Laser Interferometer
The in-plane component of the wavefield provides valuable information about media properties from seismology to nondestructive testing. A new compact scanning laser ultrasonic interferometer collects light scattered away from the angle of incidence to provide the absolute ultrasonic displacement for both the out-of-plane and an in-plane components. This new system is tested by measuring the radial and vertical polarization of a Rayleigh wave in an aluminum half-space. The estimated amplitude ratio of the horizontal and vertical displacement agrees well with the theoretical value. The phase difference exhibits a small bias between the two components due to a slightly different frequency response between the two processing channels of the prototype electronic circuitry.
Blum, Thomas E.; van Wijk, Kasper; Pouet, Bruno; and Wartelle, Alexis. (2010). "Multicomponent Wavefield Characterization with a Novel Scanning Laser Interferometer". Review of Scientific Instruments, 81(7), 073101-1 - 073101-4. http://dx.doi.org/10.1063/1.3455213